Simulation approach for studying the performances of original superstrate CIGS thin films solar cells
Identifieur interne : 002561 ( Main/Repository ); précédent : 002560; suivant : 002562Simulation approach for studying the performances of original superstrate CIGS thin films solar cells
Auteurs : RBID : Pascal:11-0433241Descripteurs français
- Pascal (Inist)
- Simulation numérique, Dispositif couche mince, Oxyde d'étain, Microélectronique, Cristal lamellaire, Optimisation, Dispositif photovoltaïque, Caractéristique courant tension, Densité courant, Epaisseur couche, Densité porteur charge, Rendement quantique, Spectre visible, Cellule solaire, Séléniure de cuivre, Séléniure de gallium, Séléniure d'indium, Cuivre, Gallium, SnO2, In2Se3, 8460J, 7361, 6855J, Dispositif photonique.
- Wicri :
- concept : Microélectronique, Cuivre.
English descriptors
- KwdEn :
- Charge carrier density, Copper, Copper selenides, Current density, Gallium, Gallium selenides, Indium selenides, Layer thickness, Layered crystals, Microelectronics, Numerical simulation, Optimization, Photonic device, Photovoltaic cell, Quantum yield, Solar cell, Thin film device, Tin oxide, Visible spectrum, Voltage current curve.
Abstract
In this work, we report on the performances of superstrate Cu(In,Ga)Se2 (CIGS) thin film solar cells with an alternative SLG/SnO2:F/CIGS/In2Se3/Zn structure using AMPS-1D (Analysis of Microelectronic and Photonic structures) device simulator. An inverted surface layer, n-type CIGS layer, is inserted between the In2Se3 buffer and CIGS absorber layers and the SnO2:F layer is just a transparent conducting oxide (TCO). The simulation has been carried out by lighting through SnO2:F. The obtained results show that the existence of so-called 'ordered defect compound' (ODC) layer in such a structure is the critical factor responsible for the optimization of the performances. Photovoltaic parameters were determined using the current density-voltage (J-V) curve. An optimal absorber and ODC layer thickness has been estimated, that improve significantly the devices efficiency exceeding 15% AM1.5 G. The variation of carrier density in In2Se3 layer has an influence on the superstrate CIGS cells performances. Moreover, the quantum efficiency (Q.E.) characteristics display a maximum value of about 80% in the visible range.
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Pascal:11-0433241Le document en format XML
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<author><name sortKey="Djessas, K" uniqKey="Djessas K">K. Djessas</name>
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<author><name sortKey="Djahli, F" uniqKey="Djahli F">F. Djahli</name>
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<author><name sortKey="Bouloufa, A" uniqKey="Bouloufa A">A. Bouloufa</name>
<affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Laboratoires C.C.N.S. et E. M., Université Ferhat Abbas de Sétif</s1>
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<term>Current density</term>
<term>Gallium</term>
<term>Gallium selenides</term>
<term>Indium selenides</term>
<term>Layer thickness</term>
<term>Layered crystals</term>
<term>Microelectronics</term>
<term>Numerical simulation</term>
<term>Optimization</term>
<term>Photonic device</term>
<term>Photovoltaic cell</term>
<term>Quantum yield</term>
<term>Solar cell</term>
<term>Thin film device</term>
<term>Tin oxide</term>
<term>Visible spectrum</term>
<term>Voltage current curve</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Simulation numérique</term>
<term>Dispositif couche mince</term>
<term>Oxyde d'étain</term>
<term>Microélectronique</term>
<term>Cristal lamellaire</term>
<term>Optimisation</term>
<term>Dispositif photovoltaïque</term>
<term>Caractéristique courant tension</term>
<term>Densité courant</term>
<term>Epaisseur couche</term>
<term>Densité porteur charge</term>
<term>Rendement quantique</term>
<term>Spectre visible</term>
<term>Cellule solaire</term>
<term>Séléniure de cuivre</term>
<term>Séléniure de gallium</term>
<term>Séléniure d'indium</term>
<term>Cuivre</term>
<term>Gallium</term>
<term>SnO2</term>
<term>In2Se3</term>
<term>8460J</term>
<term>7361</term>
<term>6855J</term>
<term>Dispositif photonique</term>
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<front><div type="abstract" xml:lang="en">In this work, we report on the performances of superstrate Cu(In,Ga)Se<sub>2</sub>
(CIGS) thin film solar cells with an alternative SLG/SnO<sub>2</sub>
:F/CIGS/In<sub>2</sub>
Se<sub>3</sub>
/Zn structure using AMPS-1D (Analysis of Microelectronic and Photonic structures) device simulator. An inverted surface layer, n-type CIGS layer, is inserted between the In<sub>2</sub>
Se<sub>3</sub>
buffer and CIGS absorber layers and the SnO<sub>2</sub>
:F layer is just a transparent conducting oxide (TCO). The simulation has been carried out by lighting through SnO<sub>2</sub>
:F. The obtained results show that the existence of so-called 'ordered defect compound' (ODC) layer in such a structure is the critical factor responsible for the optimization of the performances. Photovoltaic parameters were determined using the current density-voltage (J-V) curve. An optimal absorber and ODC layer thickness has been estimated, that improve significantly the devices efficiency exceeding 15% AM1.5 G. The variation of carrier density in In<sub>2</sub>
Se<sub>3</sub>
layer has an influence on the superstrate CIGS cells performances. Moreover, the quantum efficiency (Q.E.) characteristics display a maximum value of about 80% in the visible range.</div>
</front>
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<fA08 i1="01" i2="1" l="ENG"><s1>Simulation approach for studying the performances of original superstrate CIGS thin films solar cells</s1>
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<fA09 i1="01" i2="1" l="ENG"><s1>Proceedings of the EMRS 2010 Spring Meeting Symposium M: Thin Film Chalcogenide Photovoltaic Materials Strasbourg, France</s1>
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<fA11 i1="01" i2="1"><s1>BOUCHAMA (I.)</s1>
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<s9>ed.</s9>
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<fA12 i1="05" i2="1"><s1>ABOU-RAS (Daniel)</s1>
<s9>ed.</s9>
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<fA14 i1="01"><s1>Laboratoire Procédés Matériaux et Energie solaire PROMES-CNRS, Rambla de la Thermodynamique, Technosud</s1>
<s2>66100 Perpignan</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
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<sZ>3 aut.</sZ>
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<fA14 i1="03"><s1>Laboratoires C.C.N.S. et E. M., Université Ferhat Abbas de Sétif</s1>
<s3>DZA</s3>
<sZ>4 aut.</sZ>
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<fA18 i1="01" i2="1"><s1>the European Materials Research Society (E-MRS</s1>
<s3>EUR</s3>
<s9>org-cong.</s9>
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<fC01 i1="01" l="ENG"><s0>In this work, we report on the performances of superstrate Cu(In,Ga)Se<sub>2</sub>
(CIGS) thin film solar cells with an alternative SLG/SnO<sub>2</sub>
:F/CIGS/In<sub>2</sub>
Se<sub>3</sub>
/Zn structure using AMPS-1D (Analysis of Microelectronic and Photonic structures) device simulator. An inverted surface layer, n-type CIGS layer, is inserted between the In<sub>2</sub>
Se<sub>3</sub>
buffer and CIGS absorber layers and the SnO<sub>2</sub>
:F layer is just a transparent conducting oxide (TCO). The simulation has been carried out by lighting through SnO<sub>2</sub>
:F. The obtained results show that the existence of so-called 'ordered defect compound' (ODC) layer in such a structure is the critical factor responsible for the optimization of the performances. Photovoltaic parameters were determined using the current density-voltage (J-V) curve. An optimal absorber and ODC layer thickness has been estimated, that improve significantly the devices efficiency exceeding 15% AM1.5 G. The variation of carrier density in In<sub>2</sub>
Se<sub>3</sub>
layer has an influence on the superstrate CIGS cells performances. Moreover, the quantum efficiency (Q.E.) characteristics display a maximum value of about 80% in the visible range.</s0>
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<s5>03</s5>
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<s5>03</s5>
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<s5>04</s5>
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<s5>05</s5>
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<s5>05</s5>
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<s5>06</s5>
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<s5>06</s5>
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<fC03 i1="06" i2="X" l="SPA"><s0>Optimización</s0>
<s5>06</s5>
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<s5>07</s5>
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<s5>07</s5>
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<s5>09</s5>
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<s5>09</s5>
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<s5>09</s5>
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<s5>10</s5>
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<s5>10</s5>
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<fC03 i1="10" i2="X" l="SPA"><s0>Espesor capa</s0>
<s5>10</s5>
</fC03>
<fC03 i1="11" i2="X" l="FRE"><s0>Densité porteur charge</s0>
<s5>11</s5>
</fC03>
<fC03 i1="11" i2="X" l="ENG"><s0>Charge carrier density</s0>
<s5>11</s5>
</fC03>
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<s5>11</s5>
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<s5>12</s5>
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<s5>14</s5>
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<s5>15</s5>
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<s5>16</s5>
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<s5>17</s5>
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<s2>NC</s2>
<s5>18</s5>
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<s2>NC</s2>
<s5>18</s5>
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<s5>18</s5>
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<s5>19</s5>
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<s2>NC</s2>
<s2>FX</s2>
<s5>19</s5>
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<fC03 i1="19" i2="X" l="SPA"><s0>Galio</s0>
<s2>NC</s2>
<s2>FX</s2>
<s5>19</s5>
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<fC03 i1="20" i2="X" l="FRE"><s0>SnO2</s0>
<s4>INC</s4>
<s5>46</s5>
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<s4>INC</s4>
<s5>47</s5>
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<fC03 i1="22" i2="X" l="FRE"><s0>8460J</s0>
<s4>INC</s4>
<s5>71</s5>
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<fC03 i1="23" i2="X" l="FRE"><s0>7361</s0>
<s4>INC</s4>
<s5>72</s5>
</fC03>
<fC03 i1="24" i2="X" l="FRE"><s0>6855J</s0>
<s4>INC</s4>
<s5>73</s5>
</fC03>
<fC03 i1="25" i2="X" l="FRE"><s0>Dispositif photonique</s0>
<s4>CD</s4>
<s5>96</s5>
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<fC03 i1="25" i2="X" l="ENG"><s0>Photonic device</s0>
<s4>CD</s4>
<s5>96</s5>
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<s4>CD</s4>
<s5>96</s5>
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<fN21><s1>297</s1>
</fN21>
<fN44 i1="01"><s1>OTO</s1>
</fN44>
<fN82><s1>OTO</s1>
</fN82>
</pA>
<pR><fA30 i1="01" i2="1" l="ENG"><s1>EMRS Spring Meeting Symposium M: Thin Film Chalcogenide Photovoltaic Materials</s1>
<s2>10</s2>
<s3>Strasbourg FRA</s3>
<s4>2010-06-07</s4>
</fA30>
</pR>
</standard>
</inist>
</record>
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